TM 1–1520–238–T–3
15–14
Change 4
15–48 SIGNAL NAME:
CPG SYMBOL BRT TO SYMBOL GEN (ACY) SYMG CPG SYM BRT (ACZ)
MEMORY LOCATION: 001172
MEMORY DATA BIT(S):
4–19 (ACY) 4–15 (ACZ)
(SCALAR)
CONDITION:
Monitor HOD while increasing symbol brightness; memory location response should
increase when brightness is increased and decrease when brightness is decreased.
SIGNAL FUNCTION:
Controls ORT SYM GEN brightness.
REMARKS: From FCC through LH FAB MRTU Type I to symbol generator.
PASS:
If CONDITION is met, go to paragraph 15–49.
FAIL: Location of fault: LH FAB MRTU Type I, wiring from LH FAB MRTU Type I to symbol generator,
symbol generator to FCC. Troubleshoot wiring to isolate fault (TM 9–1230–476–20–2).
15–49 SIGNAL NAME:
CPG SYMBOL BRT TO TEU (ACY) TEU CPG SYM BRT (ACZ)
MEMORY LOCATION: 001174
MEMORY DATA BIT(S):
4–19 (ACY) 4–15 (ACZ)
(SCALAR)
CONDITION:
Monitor HOD while increasing symbol brightness; memory location response should
increase when brightness is increased and decrease when brightness is decreased.
SIGNAL FUNCTION:
Controls CPG SYM brightness.
REMARKS: From FCC through LH FAB MRTU Type I to TEU.
PASS:
If CONDITION is met, go to paragraph 15–50.
FAIL: Location of fault: LH FAB MRTU Type I, wiring from LH FAB MRTU Type I to TEU, TEU.
Troubleshoot wiring to isolate fault (TM 1–1270–476–T).
15–50 SIGNAL NAME:
ORT SYM BRT ADJ TO TEU (ACY) CPG SYMBR ADJ TST (ACZ)
MEMORY LOCATION: 001256
MEMORY DATA BIT(S):
4–19 (ACY) 4–15 (ACZ)
(SCALAR)
CONDITION:
Monitor HOD while increasing symbol brightness; memory location response should
increase when brightness is increased and decrease when brightness is decreased.
SIGNAL FUNCTION:
Used during FD/LS.
REMARKS: From FCC through LH FAB MRTU Type I to TEU.
PASS:
If CONDITION is met, go to paragraph 15–51.
FAIL: Location of fault: LH FAB MRTU Type I, wiring from LH FAB MRTU Type I to TEU, TEU.
Troubleshoot wiring to isolate fault (TM 1–1270–476–T).
15–51 SIGNAL NAME:
ORT IHADSS BRT TO TEU (ACY) CPG BRT ADJ TST (ACZ)
MEMORY LOCATION: 001260
MEMORY DATA BIT(S):
4–19 (ACY) 4–15 (ACZ)
(SCALAR)
CONDITION:
Monitor HOD while increasing brightness; memory location response should increase
when brightness is increased and decrease when brightness is decreased.
SIGNAL FUNCTION:
Used during FD/LS.
REMARKS: From FCC through LH FAB MRTU Type I to TEU.
PASS:
If CONDITION is met, go to paragraph 15–52.
FAIL: Location of fault: LH FAB MRTU Type I, wiring from LH FAB MRTU Type I to TEU, TEU.
Troubleshoot wiring to isolate fault (TM 1–1270–476–T).
