TM 1–1520–238–T–3
Change 4
3–5
3–13 SIGNAL NAME:
DASEC STATUS WORD DISCRETE OUTPUT BIT (ACY) DO BIT (ACZ)
MEMORY LOCATION: 002113
MEMORY DATA BIT(S):
16
(BINARY)
CONDITION:
(None)
SIGNAL FUNCTION:
Indicates status of 5 VDC and 28 VDC discretes.
REMARKS: From DASEC to FCC.
PASS:
If second digit displayed on HOD is 1, 3, 5, or 7, go to paragraph 3–14.
FAIL: Location of fault: replace DASEC (TM 1–1520–238–23).
3–14 SIGNAL NAME:
DASEC STATUS WORD DC ANALOG OUTPUT BIT (ACY) DCO BIT (ACZ)
MEMORY LOCATION: 002113
MEMORY DATA BIT(S):
15
(BINARY)
CONDITION:
(None)
SIGNAL FUNCTION:
Indicates status of DC analog circuits.
REMARKS: From DASEC to FCC.
PASS:
If second digit displayed on HOD is 3 or 7, go to paragraph 3–15.
FAIL: Location of fault: replace DASEC (TM 1–1520–238–23).
3–15 SIGNAL NAME:
DASEC STATUS WORD AD/DA BIT (ACY) ADA BIT (ACZ)
MEMORY LOCATION: 002113
MEMORY DATA BIT(S):
13
(BINARY)
CONDITION:
(None)
SIGNAL FUNCTION:
Indicates status of analog–to–digital and digital–to–analog circuits.
REMARKS: From DASEC to FCC.
PASS:
If third digit displayed on HOD is 1, 3, 5, or 7, go to paragraph 3–16.
FAIL: Location of fault: replace DASEC (TM 1–1520–238–23).
3–16 SIGNAL NAME:
DASEC STATUS WORD FD/LS TEST
MEMORY LOCATION: 002113
MEMORY DATA BIT(S):
12
(BINARY)
CONDITION:
(None)
SIGNAL FUNCTION:
Indicates FD/LS ground test is being run.
REMARKS: From DASEC to FCC.
PASS:
If third digit displayed on HOD is 1 or 5, go to paragraph 3–17.
FAIL: Location of fault: replace DASEC (TM 1–1520–238–23).
3–17 SIGNAL NAME:
DASEC STATUS WORD ASE BIT (ACY) DASE BIT STATUS (ACZ)
MEMORY LOCATION: 002113
MEMORY DATA BIT(S):
11
(BINARY)
CONDITION:
(None)
SIGNAL FUNCTION:
Indicates last FD/LS test ASE bit status.
REMARKS: From DASEC to FCC.
PASS:
If third digit displayed on HOD is 1, go to paragraph 3–18.
FAIL: Location of fault: replace DASEC (TM 1–1520–238–23).
